White Paper

Selecting your ICP-OES analyzer’s plasma interface: axial-view, radial-view, dual-view or new MultiView

This new paper reviews the core concepts surrounding the optical interfaces that are available for ICP-OES spectrometers, today and discusses the relative strengths and weaknesses of each approach.

The paper explains how each technique works and why understanding the plasma-viewing interface should be a major factor in the selection of the best technology and instrument for your laboratory or specific area of research.

The paper also introduces a unique new ICP-OES plasma observation approach called “MultiView”. MultiView technology was recently introduced by SPECTRO Analytical Instruments in its new SPECTRO ARCOS ICP-OES and offers users full axial sensitivity and full radial precision without any dual-view compromises. MultiView enables the user to analyze samples of a wide spectrum of matrices and benefits from:

  • Rapid operational readiness
  • High availability
  • High sample throughput

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