White Paper

Comparing ICP-OES Analyzers’ Plasma Views: Axial, Radial, Dual, MultiView, and New Dual Side-On Interface

This new paper reviews the core concepts surrounding the optical interfaces that are available for ICP-OES spectrometers, today and discusses the relative strengths and weaknesses of each approach.

The paper explains how each technique works and why understanding the plasma-viewing interface should be a major factor in the selection of the best technology and instrument for your laboratory or specific area of research.

The paper also introduces SPECTRO’s new DSOI technology, a brand-new approach to the critical issue of plasma view design, uses a vertical plasma torch, observed via a new direct radial-view technology. Two optical interfaces capture emitted light from both sides of the plasma, using only a single extra reflection, for added sensitivity and elimination of issues plaguing newer vertical-torch dual-view models. As a result, DSOI provides twice the sensitivity of conventional radial systems — yet avoids the complexity, drawbacks, and cost of vertical dual view models.

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